Two models are available: single wavelength (1310 nm) and dual wavelength (1310 and 1550 nm). Control software for Windows 11, an optional dedicated sensor head for loss measurement, several master codes (compatible with various connector types), and a distance adjustment code for setting the initial measurement position have also been released.
Among the key new features is the AQ7420's ability to reduce spurious noise. With conventional OLCR/OFDR-based devices, spurious (ghost) noise is often observed in areas where there is no actual reflection (depending on the equipment's characteristics), leading to inaccurate interpretations. In such situations, accurate waveform analysis relies heavily on users with specialized knowledge.
Another notable feature is the ability to simultaneously measure back reflection and insertion loss. Conventional OLCR/OFDR instruments are often unable to accurately measure back reflection due to the poor measurement accuracy of the vertical axis (amount of reflection level). The AQ7420 high-resolution reflectometer overcomes this problem by enabling measurements with an uncertainty of ±3 dB. Furthermore, by utilizing the optical sensor head, users can simultaneously measure insertion loss with an uncertainty of ±0.02 dB.
Another important feature is the reduction in measurement time. Compared to the previous generation product (AQ7410), the measurement time of the new AQ7420 high-resolution reflectometer is about 50% faster, approximately 6 seconds versus the previous 12 seconds.
