Today's instrumentation performs measurements, provides data that we can analyze, and allows us to draw conclusions quickly. We will see how to detect and correct various sources of error. Nanotechnology requires low-power measurement and generation, both in current and voltage. The ability to measure in pulsed mode allows for isothermal IV measurements, pulse load measurements, and stress measurements using alternating current.
Topics to be discussed include:
- Typical measurements and connections in research and nanotechnology. Measurements on wafers with probe stations.
- Measurement techniques necessary to measure low currents, low and high resistances in materials or devices with a manometer scale.
- Sources of error that affect measurements on semiconductors, nanomaterials, and other devices.
- Measurement solutions applicable to semiconductors, nanodevices and materials.
- Characterization and connections of carbon nanotube and single-electron devices.
-Why are pulsed tests critical for nanodevices?
- Devices with isothermal limits (90 nm, 65 nm, FinFET, SOI, LDMOS (high power)
- Charge locking (Dielectrics with K raised to 65 nm or lower)
- Degradation of mobility due to cargo capture.
- AC stress testing for device reliability and lifetime testing.
- Pulsed charging for high k gate dielectrics
- Multifrequency CV tests: Dielectric thickness, global and interface charging characteristics, doping profiles.
- Bioelectronics and biosensors.
-Memory test.
Seminar 2: The new Script Processor in LXI instruments simplifies programming in multimeters, switching systems, and source/meter units, enabling faster measurements in more cost-effective systems.
This presentation provides an overview of the new capabilities of common instruments, including multimeters, dataloggers, switching systems, and source/meter units. It will demonstrate why LXI instruments will soon replace GPIB-based equipment (IEEE-488GPIB num in the near future).
Topics to be discussed include:
- Evolution in DC test technology.
- Why LXI?
- TSP programming: how to reduce software development time by 60%.
- Why is TSP faster and more cost-effective than GPIB programming?
- How TSP-LINK simplifies synchronization between multiple instruments.
- Instruments that combine metering and switching capabilities.
You will also see a probe station.
