Use the cursor tools to measure and examine the scattering level and reflection events to measure the RL and IL of closely spaced events.
MAIN FEATURES
- "Zero dead zone" reflectometer for optical components and systems
- Operates at 1040 - 1080 nm
- Sampling resolution of 10 μm at 30 m length
- Dynamic range of 80 dB
- Backscatter level sensitivity (-130 dB)
- High-speed scanning
- Measures IL, RL, distributed loss, distance, polarization states, phase derivative, and group delay
APPLICATIONS
- Analyze distributed loss in components and short optical networks
- Locate, identify and resolve macrobends, splices, connectors and breaks
- Test and troubleshoot short-lived networks and systems
- Unprecedented visibility into miniaturized components
