The CT400 passive component tester combines with Yenista tunable lasers to create a complete wavelength sweep measurement system. It features a wavelength resolution of 1 pm and a wavelength accuracy of 5 pm. A single wavelength sweep achieves a dynamic range of 65 dB with a typical measurement time of 3.5 seconds. Models are available to cover any wavelength in the 1240–1680 nm range. The CT400 can also be integrated with external power or current meters to enable the characterization of high-port-density devices and integrated silicon photonic components.
The new XTA-50 tunable filter, built on Yenista's tunable filter technology, offers a new touchscreen user interface and Ethernet communication. The XTA-50 is available in four models covering the O, S, C, and L wavelength bands with bandwidths from 32 pm (4 GHz) to 5 nm.
Yenista introduced its OSA20 optical spectrum analyzer in March of this year. Additional features have been added for measuring the gain and noise of optical amplifiers (EDFAs). The OSA20 boasts the highest Optical Rejection Ratio (ORR) of any instrument, a parameter that enables accurate noise measurements even with closely spaced DWDM signals. A dedicated "burst signal" mode has also been added for precise spectrum measurement in PON networks regardless of the duty cycle (1 to 100%).
