With the second-generation VST, engineers can simultaneously generate and measure up to 32 LTE carriers, each with 20 MHz of bandwidth, and use the software to specify various carrier space schemes.
The latest version of NI-RFmx also includes algorithm improvements to reduce measurement time. Engineers performing spectral and modulation quality measurements for wireless technologies such as UMTS/HSPA+ and LTE/LTE-Advanced Pro can expect to see an EVM measurement time reduction of up to 33 percent.1 by installing the latest software version. The measurement speed improvements in NI-RFmx are part of NI's ongoing efforts to help customers reduce testing costs with faster measurements.
“By adopting PXI and LabVIEW along with NI-RFmx measurement software, we’ve seen many semiconductor customers significantly reduce test time for RF measurements, which lowers testing costs and accelerates time to market,” said Charles Schroeder, vice president of RF at NI. “The combination of good documentation, a wealth of sample code, and good integration with PXI hardware like the second-generation VST has helped our customers quickly and easily adopt NI-RFmx in their test systems.”
In addition to algorithm improvements, NI-RFmx also adds more support for measurements such as intermodulation distortion, third-order intersection, and cold source and Y-factor noise figure measurements. These measurements integrate seamlessly with the PXIe-5668R RF signal analyzer, allowing engineers to easily configure high-performance PXI intermodulation distortion and noise figure test suites. Current NI-RFmx users can click here to download and start using the latest version.
 
1Based on numerous R&D test benches in configurations that represent a typical use case.

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