The LTE-Advanced protocol represents a further step in the ongoing evolution of LTE. However, for its successful market penetration, proper testing and measurement remain essential throughout the development lifecycle. Previous LTE-Advanced signal generation and analysis solutions introduced by Agilent—completely new to the market at the time—addressed this issue directly during the R&D phase. Now, the integrated measurement application of the X Series for LTE-Advanced tackles this challenge during the design validation and manufacturing phases.
The new LTE-Advanced measurement application brings one-touch measurement capabilities to Agilent X-Series instruments and modular signal analyzers. Offering fast measurement speeds, SCPI programmability, accept/fail testing, and ease of use, the application is ideal for design verification and manufacturing.
“Validating and manufacturing LTE-Advanced transmitters and components requires the best and most up-to-date solutions on the market,” explained Andy Botka, vice president and general manager of Agilent’s Microwave and Communications Division. “This new integrated measurement application, broadly compliant with the 3GPP Release 11 specification, will further enhance our impeccable track record of innovation in emerging mobile protocols and provide our customers with the superior insights and confidence they need to perform LTE-Advanced mobile communications testing.”
Easier approach to RF specification compliance testing
Agilent's LTE-Advanced measurement application offers the most comprehensive RF specification compliance testing on the market for both contiguous and non-contiguous LTE-Advanced transmitter configurations, as defined in the 3GPP Release 11 specification. Supported measurements include testing transmitter characteristics such as output power, transmitted signal quality, and unwanted emissions from both base stations and user equipment.
Furthermore, the measurement application supports cumulative adjacent channel leakage (CACLR) and cumulative spectrum emission (SEM) mask measurements for intra-band non-contiguous carrier aggregation, a new requirement of 3GPP Release 11. Intra-band non-contiguous configurations present unique challenges in RF measurements of unwanted emissions, as another operator may deploy spectrum within the sub-block interval. The new CACLR requirement measurement and unique SEM mask measure the contributions of carriers on both sides of the sub-block interval. The new LTE-Advanced measurement application is the only solution on the market that incorporates both CACLR and a unique SEM mask for non-contiguous carrier aggregation.
X Series measurement applications
The X-Series measurement applications enhance the capabilities and functionality of Agilent signal analyzers to accelerate data acquisition. They provide essential measurements for specific tasks across general-purpose applications, mobile communications, wireless connectivity, and digital video, covering more than 40 protocols or modulation types. These applications are compatible with both benchtop and modular instruments. The only difference lies in the performance level achieved by the selected hardware. Choose the performance level required for your application and rest assured that the calculations and algorithms will remain consistent across all your signal analyzers, from development to manufacturing.
