Main features:
1. Fast Sampling and Data Transfer:
The OPM AQ23211A/AQ23212A features an averaging time of 20 µs*, a substantial improvement over the previous 100 µs. This improvement enables faster and more accurate data collection, enhancing measurement efficiency. Furthermore, the transfer time for files containing up to 100,001 data points is now less than one second, allowing for high-speed transfer of large volumes of data. For optical power logging measurements, the maximum number of data points has been increased from 20,001 to 1,000,001.
2. Synchronization with SMU
Part of the development objective was for the new OPMs to also integrate seamlessly with the already released AQ23811A SMU within the AQ2300 Series modular, single-hull, multi-application test system. The SMU offers high-quality pulse waveform generation (50 µs width), high interoperability, and the ability to perform simultaneous voltage and current measurements. Users can synchronize the SMU and OPMs within the rack without any additional wiring.
According to Yokogawa's research, the AQ2300 series modular multi-application test system, which houses both the SMU and the new AQ23211A/AQ23212A OPMs in a single rack, is the first solution of its kind available on the market. The rack incorporates a digital I/O interface that can be connected to external devices, allowing the AQ2300 to receive measurement start signals and transmit measurement end signals. This feature enhances the system's flexibility and adaptability, making it suitable for small and medium-sized measurement systems.
* Time of repetition of measurements to calculate the average value.
Main target markets:
- Manufacturers of semiconductor devices in the communications field.
- Manufacturers of passive optical components, including optical fibers.
- Suppliers of optical component assembly or testing equipment.
- Universities and research institutes.
Applications:
- Measurement of optical semiconductor components such as LEDs, LDs, PDs, transceivers, transmission equipment, and optical waveguides.
- Measurement of electrical semiconductor components, such as transistors and FETs.
- Measurement of passive optical components, such as optical fibers.
