The GUI displays graphs and analysis results simultaneously on two external screens.
The platform is designed for high-performance measurements in both R&D and production environments. It covers the wavelength range of 1240 to 1680 nm and can independently test four devices simultaneously. A single-wavelength scan with an external tunable laser provides insertion loss and return loss measurements with a dynamic range of 70 dB. The platform's power meters enable precise characterization of small ripples (0.1 mdBm/μs) and sharp extremes (>1 dB/μs) for high-end filters and microresonators with slopes up to 10,000 dB/nm.
“With the CTP10, we’ve achieved an exponential increase in performance. The platform has an unprecedented capacity to handle and analyze massive volumes of measurement data. It can host up to 60 power meters, acquiring data at 1 Msps per power meter,” says David Heard, Sales Director at Yenista. “The GUI is also impressive. It’s based on the philosophy of our OSA20 optical spectrum analyzer and focuses on the application, rather than the instrument. Setting up measurements and analyzing results is now simple and intuitive.”
In March, the CTP10 was successfully showcased for the first time in a live demonstration at OFC 2017. The product will be available commercially in the fourth quarter of 2017.

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