The procedure combines an Anritsu millimeter-wave measurement solution based on a signal analyzer with a 60 GHz near-field probe from CANDOX Systems.
To evaluate the method, its results were compared with far-field measurements corresponding to certification procedures established under Japanese legislation.
The measurements used to determine the differences between the two methods were performed at the laboratory of TÜV Rheinland Japan, an independent certification body.
The evaluation compared the results obtained using the far-field procedure employed in the certification methods covered by the Japanese Radio Act with those obtained using the near-field probe.
According to Anritsu, applying this data to near-field measurements yielded a correlation with the results of the certification measurements.
The evaluated solution uses a 60 GHz near-field probe developed by CANDOX Systems in conjunction with Anritsu's millimeter-wave measurement system.
This approach allows measurements to be taken in a more compact environment than that required by conventional far-field procedures with large anechoic chambers.
The difference between the measurements obtained using both methods is characterized beforehand and then used to correlate the near-field results with those of the certification procedure.
Anritsu and CANDOX present the system as a solution for production testing, where the space occupied by the equipment and the time required to perform each measurement can limit manufacturing capacity.
Eliminating the need for a large anechoic chamber could reduce the physical space dedicated to the testing system. The companies also point to a potential reduction in investment and improvements in production efficiency.
The evaluation focuses on radar and detection products operating in the 60 GHz band.
Applications cited include vital signs monitoring, motion detection, security systems, and industrial equipment.
The press release links the development of the method to increased production volumes of these devices and the need for more compact testing systems.
However, no figures are provided regarding the size or growth of the 60 GHz sensor market.
It does not automatically replace the certification test.
The evaluation demonstrates, according to Anritsu, that near-field measurements can be correlated with the results obtained through the certification procedure after applying the difference data determined during the comparison.
This should not be automatically interpreted as a formal replacement for the certification test required by Japanese law.
