The reference solution is optimized for high performance and high measurement accuracy. It is the only small-footprint, comprehensive characterization solution for design validation and product testing of RF power amplifiers, as well as all related passive devices such as filters and duplexers.
The robust digital predistortion (DPD) algorithms integrated into the reference solution are based on years of close collaboration with manufacturers in the mobile communications industry and on data obtained using Keysight's SystemVue simulation software and Signal Studio N7614B power amplifier testing software. This makes it the only solution capable of providing consistent measurements, from simulation to manufacturing, for next-generation power amplifier modules.
DPD's proven algorithms, with lookup table and memory polynomial capabilities, complement the solution's envelope tracking (ET) testing capabilities. The solution is equipped with fast waveform download, tight synchronization, and automated calibration—all essential features for ET testing. The reference solution supports devices from various manufacturers, such as Signadyne's high-speed PXIe arbitrary waveform generator and AOU-H3353 SD card slot, and delivers the fastest envelope generation on the market while minimizing the space required for testing.
“The combination of Keysight’s excellence in RF solutions and Signadyne’s know-how on high-speed generators has resulted in the development of a comprehensive test solution that brings tremendous value to the RF power amplifier sector,” said Marc Almendros, CEO of Signadyne.
“We created the PXI reference solution for RF power amplifier characterization and testing because customers told us that comprehensive characterization of PAD-type devices is essential for achieving quality products,” said Mario Narduzzi, Marketing Director of Keysight’s Software and Modular Solutions Division. “The proven and robust digital predistortion algorithms, with open- and closed-loop measurements, deliver superior performance compared to any other PA characterization testing solution on the market.”.
The new PXIe M937xA Vector Network Analyzer and PXIe M9393A High-Performance Vector Signal Analyzer provide the comprehensive characterization that customers need, including essential high-density, high-speed s-parameter measurements and high-speed harmonic distortion testing up to 27 GHz.
The open-source sample code for the reference solution is optimized for PA characterization. Its design facilitates rapid evaluation of test setups and reduces the time to first measurement. With these new capabilities, engineers can improve the performance of devices with DPD and ET, reduce device size and cost while increasing complexity and testing requirements, integrate more capabilities into PAD-type devices, and reduce the size of test stations used to test multiple or complex devices.
Keysight's modular products and reference solutions benefit greatly from the company's highly reliable measurement science and calibration routines. This allows customers to be confident in consistent measurement results from R&D to manufacturing, accelerating design cycles.
Power amplifier modules (PADs) are emerging as an increasingly popular alternative to more traditional power amplifier architectures. In addition to lower power consumption and improved efficiency and value, they allow device designers to save and optimize space by replacing multiple discrete components with a single compact module. Furthermore, PAD adoption is rapidly growing among device designers due to the trend toward a greater number of bands resulting from the implementation of new LTE networks.
