The new Anritsu BERTWave MP2110A with its high-speed sampling reduces measurement times and the performance of the high-sensitivity error detector improves yields to reduce optical modules and device production costs.
Unlike previous measurement environments that required two separate instruments to measure BER and analyze Eye Pattern, the MP2110A supports simultaneous measurements, saving equipment installation space. Furthermore, to shorten takt times on optical modules and device production lines, the MP2110A's maximum sampling rate has been increased to 250 kmsamples/s, reducing Eye Pattern analysis times for Eye Mask testing by 75%. The MP2110A also supports options to expand the bit error tester (BERT) to 4 channels up to 28.2 Gbit/s, and the built-in sampling oscilloscope to 2 channels. As a result, the MP2110A can simultaneously perform TRx BER measurements of multichannel optical modules, such as QSFP28, and simultaneous 2-channel Eye Pattern analysis, drastically reducing measurement times by 65% compared to previous measurement systems.
With a minimum sensitivity of -15 dBm (typical SMF), the sampling oscilloscope's optical interface supports accurate Eye Pattern analysis of signals attenuated by switches, etc. Excellent PPG jitter performance of only 600 fs rms (typical) and ED sensitivity of 25 mV (typical) also support better-performing measurements than the device under test (DUT).
