The MN4765B module, combined with the MS4640B VNA, offers a simplified approach to optoelectronic measurements and is a cost-effective alternative to the conventional total system approaches currently used in R&D and manufacturing environments.
Magnitude and phase characterization is achieved using a primary standard characterized by NIST and performed in Anritsu's calibration laboratory. This results in improved measurement uncertainty when the MN4765B is used with VectorStar across the VNA's wide frequency range. With the MN4765B module, the MS4640B can perform high-precision, traceable, corrected transfer function, group delay, and return I/O and O/E loss measurements of components and subsystems.
The MN4765B optical modules are designed with an InGaAs photodiode that converts modulated signals into electrical optical signals. The photodiode has an exceptional bandwidth response at 70 GHz and 110 GHz. Additional circuitry for temperature and bias stability is also incorporated into the modules.
Broadband Solution Also Available:
Anritsu will also release an option for the MN4765B that will allow the module to be used with the ME7838x Broadband VectorStar VNA series for industry-leading, precise optoelectronic measurements from 70 kHz to 110 GHz in the 1550 nm range. The broadband configuration expands the applications for which the optoelectronic solution can be used for universities and research laboratories. Because it uses a NIST-characterized photodiode as the primary standard, it is a superior approach to current methods that rely on an uncharacterized diode, resulting in uncertainties of 3–5 dB.
