Combined with a suite of analysis tools, the SDS5000X HD and SDS5000L models are designed to meet the evolving demands of today's power electronics, embedded systems, and automated test applications.
The SDS5000X HD models feature a touchscreen interface ideal for bench work and interactive debugging, while the rack-mount SDS5000L variants are optimized for integration into automated test systems, offering full remote control and a space-saving design without the need for an integrated display.
The SDS5000X HD and SDS5000L series offer sampling rates up to 5 GSa/s. Each channel supports up to 500 Mpts of memory (with all channels active), enabling long-duration, high-resolution acquisitions ideal for analyzing protocol sequences. In quarter-channel mode, the memory depth expands to 2.5 Gpts per channel, allowing for in-depth signal analysis over extended periods. An effective bit number (ENOB) of up to 8.2 at 1 GHz ensures excellent dynamic range and signal accuracy, even at full bandwidth.
Combined with a background noise of only 140 µVrms at 1 GHz, the new models offer clear and detailed signal visibility.
Application-focused multichannel analysis: An 8-channel oscilloscope enables comprehensive three-phase power analysis by allowing simultaneous connection to all voltage and current signals. This synchronized acquisition ensures accurate, real-time measurement of waveforms and key parameters across all phases.
Engineers can observe and compare phase relationships to detect imbalances and verify system performance. With built-in FFT capabilities, the oscilloscope also supports detailed harmonic analysis of three-phase systems.
The optional application software further expands functionality by providing vector diagram visualization for motor diagnostics, power quality assessment, ripple measurement, and overall system efficiency analysis. Beyond power analysis, modern electronic systems increasingly rely on multiple integrated chips and modules, whose initialization and operation must be carefully coordinated to avoid undefined states.
Power-on sequence testing verifies that the signals from different circuit modules follow the correct timing, ensuring system stability and preventing issues such as data transmission errors in communication systems. As circuit complexity increases, so do the challenges of power-on testing. The SDS5000X HD addresses this challenge by capturing the entire power-on process of all relevant signals in a single acquisition. This reduces measurement time, improving efficiency and minimizing errors associated with repeated testing. For complex designs with up to eight power rails, this single-shot measurement capability is a powerful tool for reliable validation.
With the introduction of Siglent’s latest 8-channel oscilloscopes and the new ODP6000B series of optically isolated differential probes, a gap in wideband semiconductor (WBG) testing is now filled. The SDS5000X HD delivers picosecond-level rise time performance, enabling precise capture of the fast-switching behavior characteristic of silicon carbide (SiC) and gallium nitride (GaN) devices. It provides detailed analysis of voltage and current transients during switching events, including overshoots, oscillations, and other dynamic effects.
Complementing these capabilities, the ODP6000B probes are available in 500 MHz and 1 GHz bandwidths and feature an exceptional 160 dB common-mode rejection ratio (CMRR) at low frequencies, further enhancing accuracy and noise immunity—essential for advanced WBG device measurements.
