The 53100A phase noise analyzer is designed for engineers and scientists who rely on accurate measurement of frequency signals generated for 5G networks, data centers, commercial and military aircraft systems, spacecraft, communications satellites, and metrology applications. Capable of measuring radio frequency (RF) signals up to 200 MHz, the new test instrument rapidly acquires frequency signals and quickly and accurately characterizes phase noise, phase jitter, Allan deviation (ADEV), and time deviation (TDEV).
The 53100A phase noise analyzer allows for a variety of configurations by enabling up to three separate devices to be tested simultaneously using a single reference, thus providing greater capacity for stability measurements. Measuring 344 x 215 x 91 mm (13.5 x 8.5 x 3.6 in), the phase noise test instrument is small enough to be integrated into automated test equipment (ATE) manufacturing systems, yet powerful enough for laboratory-grade metrology. Its interface provides compatibility with the commands and data flow of Microchip's 51xxA test suites, reducing the need to redesign existing ATE infrastructure.
The 53100A phase noise analyzer provides flexibility by allowing an input reference device to be connected via the front panel at a different nominal frequency than the device under test, enabling a single reference to characterize a variety of oscillator products. Rubidium frequency standards such as Microchip's 8040C-LN or a quartz oscillator such as Microchip's 1000C Oven-Oven Oscillator (OCXO) could be used as a reference, as well as precision oscillators from other manufacturers.
